Publications
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2004
| Article | |
|---|---|
| 1 | SL. WU, PW. Chien, SJ. Chang, S. Koh and Y. Shiraki " Influences of delta-doping position on the characteristics of SiGe-Si DCFETs " IEEE ELECTRON DEVICE LETTERS, 25, 477-479 (2004) |
| 2 | J. Yamanaka, K. Sawano, K. Nakagawa, K. Suzuki, Y. Ozawa, S. Koh, T. Hattori and Y. Shiraki " Strain relaxation and induced defects in SiGe thin films grown on ion- implanted Si substrates " Material Trans., 45, 2644-2646 (2004) |
| 3 | G. Boulon, S. Uda " Third International Symposium on Lasers and Nonlinear Optical Materials - ISLNOM-3 - " Opt. Mater., 26, preface (2004) |
| 4 | M. Yano, N. Watanabe, S. Uda, H. Shiraishi and I. Sekine " Motion of etch defects on (001) Li2B4O7 single crystal wafer " Opt. Mater., 26, 479-482 (2004) |
| 5 | K. Sawano, S. Koh, Y. Shiraki, Y. Ozawa, T. Hattori, J. Yamanaka, K. Suzuki,
K. Arimoto, K. Nakagawa and N. Usami " Fabrication of high-quality strain-relaxed thin SiGe layers by ion- implanted Si substrates " Appl. Phys. Lett., 85, 2514-2516 (2004) |
| 6 | S. Uda, H. Inaba, J. Harada and K. Hoshikawa " Growth of langasite via Bridgman technique along [0001], [21 10] and [0111] for piezoelectric applications " J. Cryst. Growth, 271 , 229-237 (2004) |
| 7 | S. Tsunekawa, S. Ito and Y. Kawazoe " Surface structures of cerium oxide nanocrystalline particles from the size dependence of the lattice parameters " Appl. Phys. Lett., 85, 3845-3847 (2004) |
| 8 | J. Yamanaka, K. Sawano, K. Nakagawa, K. Suzuki, Y. Ozawa, S.Koh, T. Hattori and Y. Shiraki " Observation of dislocations in strain-relaxed silicon-germanium thin films with flat surfaces grown on ion-implanted silicon substrates " Material Science in Semiconductor Processing, 7, 389-392 (2004) | Book |
| 1 | S. Uda " Chapter 2 Fundamentals of Growth Dynamics of the micro-Pulling Down Method " Fiber Crystal Growth from the Melt, T. Fukuda, P. Rudolph and S. Uda, Eds., Springer, Germany, 47-88 (2004) | Review |
| 1 | S. Uda and S.Q. Wang " Langasite A new piezoelectric substrate for multiple purposes " Materials Integration, 17, 49-54 (2004)(in Japanese) |
